Semiconductor Memories
Technology, Testing, and Reliability
Wiley · Print & ebook · September 10, 2002
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- Who it’s for
- Explore semiconductor memory design, testing, fault tolerance, and qualification across several technical areas.
- Themes
- Memory testing and fault tolerance, Radiation hardening and testing, Memory fabrication and architectures
- Genres
- Semiconductors, Microelectronics, Microprocessors
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Start with this bookAbout this book
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing.
Continue reading
* Memory stacks and multichip modules for gigabyte storage.
Memory Testing
Explore semiconductor memory design, testing, fault tolerance, and qualification across several technical areas.
Come here for
- Memory cell structures and fabrication technologies
- Radiation hardening and testing techniques
Expect
- Application-specific memories and architectures
- Memory stacks and multichip modules for gigabyte storage
Where it sits
| Semiconductors | 71% |
|---|---|
| Microelectronics | 35% |
| Microprocessors | 31% |
Percentages are BookFrontier’s reading of the book.
Publisher categories
- Semiconductors
- Authors
- Ashok K. Sharma
- Publisher
- Wiley
- Published
- September 10, 2002
- Format
- Print & ebook
- Theme
- Memory testing and fault tolerance · Radiation hardening and testing · Memory fabrication and architectures
- Reading lane
- Semiconductors