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Failure Analysis of Integrated Circuits by Lawrence C. Wagner

Failure Analysis of Integrated Circuits

Tools and Techniques

Lawrence C. Wagner

Springer/Sci-Tech/Trade · Print & ebook · November 9, 2012

SemiconductorsMicroelectronicsIntegrated Circuit Design
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Who it’s for
A qualitative guide to tools for tracing electrical failures in silicon-based integrated circuits.
Themes
Integrated-circuit failure analysis, Electrical failure root causes, Semiconductor analysis techniques
Genres
Semiconductors, Microelectronics, Integrated Circuit Design

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About this book

Failure Analysis of Integrated Circuits: Tools and Techniquesprovides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques.

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The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniquesis a `must have' reference work for semiconductor professionals and researchers.

Failure Analysis Tools

A qualitative guide to tools for tracing electrical failures in silicon-based integrated circuits.

Come here for

  • Decapsulation, deprocessing, and fail site isolation
  • Physical and chemical analysis techniques

Expect

  • Guidance for choosing appropriate analysis tools
  • Strengths, shortcomings, and limitations of each technique

Where it sits

Semiconductors85%
Integrated Circuit Design33%
Microelectronics29%

Percentages are BookFrontier’s reading of the book.

Publisher categories

  • Industrial Engineering
  • Superconductivity
Authors
Lawrence C. Wagner
Publisher
Springer/Sci-Tech/Trade
Published
November 9, 2012
Format
Print & ebook
Theme
Integrated-circuit failure analysis · Electrical failure root causes · Semiconductor analysis techniques
Reading lane
Industrial Engineering