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Secondary Ion Mass Spectrometry and Its Application to Materials Science by Sarah Fearn

Secondary Ion Mass Spectrometry and Its Application to Materials Science

2nd Edition, Kindle Edition

Sarah Fearn, Alexander Shard

Iop Publishing Ltd · Ebook · December 1, 2025

In this edition, a more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities.

Analytical ChemistrySpectroscopyThin Films & Surfaces
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Who it’s for
A closer account of SIMS principles and how dual-beam instruments expand analytical possibilities.
Genres
Spectroscopy, Thin Films & Surfaces, Analytical Chemistry
Published
Iop Publishing Ltd, December 1, 2025

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About this book

In this edition, a more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. This is an ideal text for final year undergraduates, first year PhD students, and anyone who may be starting out using secondary ion mass spectrometry as part of their research.

Dual-Beam SIMS

A closer account of SIMS principles and how dual-beam instruments expand analytical possibilities.

Come here for

  • A more detailed overview of SIMS principles
  • How dual-beam instruments blur traditional SIMS fields

Expect

  • Discussion of dynamic and static SIMS
  • Greater analytical possibilities enabled by dual-beam instruments

Where it sits

Spectroscopy71%
Analytical Chemistry59%
Thin Films & Surfaces54%

Percentages are BookFrontier’s reading of the book.

Publisher categories

  • Spectroscopy
Authors
Sarah Fearn, Alexander Shard
Publisher
Iop Publishing Ltd
Published
December 1, 2025
Format
Ebook
Reading lane
Spectroscopy